Channelling-enhanced microanalysis using [111] and [001] zone-axis beam incidence for L12-type Ni3(Al, Ta)

Abstract

Site occupancy has been determined using the channelling-enhanced microanalysis for a Ni₃(Al, Ta) intermetallic compound with the L1₂-type crystal structure. It is shown that there is a large scattering of data points for [001] beam incidence compared with [111] beam incidence. The reasons for this difference are examined by simulating channelling electron distribution on the Al and Ni columns. It is concluded that the large scattering for the [001] beam incidence is due to the indistinguishable difference between channelling electron intensities on the Al and Ni columns.