Parameterization of a two-stage mass spectrometer performing second-order space focusing
- 29 March 1996
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Processes
- Vol. 153 (1), 23-28
- https://doi.org/10.1016/0168-1176(95)04350-0
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- A new-regime Wiley–McLaren time-of-flight mass spectrometerReview of Scientific Instruments, 1994
- Laser ion sources for time-of-flight mass spectrometryInternational Journal of Mass Spectrometry and Ion Processes, 1994
- Large ion volume time-of-flight mass spectrometer with position- and velocity-sensitive detection capabilities for cluster beamsReview of Scientific Instruments, 1991
- High resolution time-of-flight mass spectrometers. Part III. Reflector designReview of Scientific Instruments, 1990
- Laser Tandem Mass Spectrometry in a Time of Flight InstrumentZeitschrift für Naturforschung A, 1989
- High-resolution time-of-flight mass spectrometerReview of Scientific Instruments, 1989
- High-resolution time-of-flight mass spectrometers: Part I. Effects of field distortions in the vicinity of wire meshesReview of Scientific Instruments, 1989
- Resolution in the linear time-of-flight mass spectrometerAnalytical Chemistry, 1985
- Energy Resolution of the Conventional Time-of-Flight Mass SpectrometerReview of Scientific Instruments, 1970
- Time-of-Flight Mass Spectrometer with Improved ResolutionReview of Scientific Instruments, 1955