Quantitative ARXPS depth profiling characterisation of native oxides grown on In0.53Ga0.47As(100) single crystals
- 9 December 1994
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 70 (2), 129-143
- https://doi.org/10.1016/0368-2048(94)02221-k
Abstract
No abstract availableKeywords
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