Quantitative FT-IR diffuse reflectance analysis of vinyl silanes on an aluminum hydroxide substrate

Abstract

This study extends previous work on silanized kaolin clays to other substrates, such as aluminum hydroxide. It will also show that high precision quantitative Fourier Transform Infrared Spectroscopy (FT-IR) diffuse reflectance measurements can be performed on this vinyl silanized substrate and predict that other silanized finely divided powders can be analyzed using these techniques.