Anomalous reflectance in random amorphous multilayers A-Si:H/Si1−XNX and classical localization of light ?
- 1 January 1991
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 137-138, 1095-1098
- https://doi.org/10.1016/s0022-3093(05)80313-8
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Reflectance of multilayer amorphous semiconductor films with random thickness layersPhilosophical Magazine Letters, 1990
- Optical properties of amorphous multilayers a-Si:H/a-Si3N4:H with random well or barrier layerJournal of Non-Crystalline Solids, 1989
- Optical properties of amorphous semiconductor multilayer films with random-thickness well layersPhilosophical Magazine Part B, 1989