Investigations on the mechanism of secondary ion formation from organic compounds: Amino acids
- 1 December 1982
- journal article
- Published by Elsevier in Surface Science
- Vol. 123 (1), L721-L727
- https://doi.org/10.1016/0039-6028(82)90122-4
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Fast atom bombardment of solids (F.A.B.): a new ion source for mass spectrometryJournal of the Chemical Society, Chemical Communications, 1981
- Molecular secondary ion mass spectrometryAnalytical Chemistry, 1980
- Combined XPS and SIMS study of amino acid overlayersSurface Science, 1979
- Detection, identification, and structural investigation of biologically important compounds by secondary ion mass spectrometryAnalytical Chemistry, 1978
- Secondary ion mass spectrometery: A new analytical technique for biologically important compoundsJournal of Mass Spectrometry, 1977
- Secondary-ion emission of amino acidsApplied Physics B Laser and Optics, 1976