Determination of the thermal diffuse scattering in a silicon crystal by means of the Mössbauer effect
- 1 November 1969
- journal article
- Published by Springer Nature in Il Nuovo Cimento B (1971-1996)
- Vol. 64 (1), 103-116
- https://doi.org/10.1007/bf02710285
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- The determination of x-ray temperature factors for aluminium and potassium chloride single crystals using nuclear resonant radiationProceedings of the Physical Society, 1967
- The detection of the inelastic scattering of gamma rays at crystal diffraction maxima using the Mössbauer effectPhysics Letters, 1963
- Contribution of Thermal Diffuse Scattering to Integrated Bragg Reflections from Perfect CrystalsJournal of Applied Physics, 1963
- Effect of Thermal Vibrations on Diffraction from Perfect Crystals. I. The Case of Anomalous TransmissionPhysical Review B, 1962
- Transmission and line broadening of resonance radiation incident on a resonance absorberNuclear Instruments and Methods, 1961
- X-ray incoherent scattering functions for non-spherical charge distributions: N, N−, O−, O, O+, O2+, O3+, F, F−, Si4+, Si3+, Si and GeActa Crystallographica, 1959
- Lattice Vibrations in Silicon and GermaniumPhysical Review Letters, 1959
- Intensity of X-ray reflexion from perfect and mosaic absorbing crystalsActa Crystallographica, 1950