Voltage fluctuations in small conductors
- 15 March 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 35 (8), 4123-4126
- https://doi.org/10.1103/physrevb.35.4123
Abstract
The mean-squared voltage fluctuations of an ensemble of disordered conductors, measured between probes less than an inelastic scattering length apart, are independent of the separation of the probes. The mean-squared fluctuations of the conductance can exceed /h by many orders of magnitude. To obtain these results, it is essential to take into account that carriers can make large excursions into the voltage leads without being scattered inelastically. Our results complement recent arguments and experimental findings by Benoit et al. .AE
Keywords
This publication has 18 references indexed in Scilit:
- Four-Terminal Phase-Coherent ConductancePhysical Review Letters, 1986
- Asymmetry in the Magnetoconductance of Metal Wires and LoopsPhysical Review Letters, 1986
- Theory of Aharonov-Bohm Effect in Small Normal MetalsJournal of the Physics Society Japan, 1986
- Many-channel conductance of d-dimensional pure and randomly layered materialsJournal of Physics C: Solid State Physics, 1986
- Universal conductance fluctuations in silicon inversion-layer nanostructuresPhysical Review Letters, 1986
- Active Transmission Channels and Universal Conductance FluctuationsEurophysics Letters, 1986
- Universal Conductance Fluctuations in MetalsPhysical Review Letters, 1985
- Magnetoresistance Fluctuations in Mesoscopic Wires and RingsPhysical Review Letters, 1985
- Theory of the direct force in electromigrationPhysical Review B, 1985
- Spatial Variation of Currents and Fields Due to Localized Scatterers in Metallic ConductionIBM Journal of Research and Development, 1957