Abstract
Using the evanescent-wave ellipsometry technique, we have observed the growth of a disordered liquid-crystal layer adjacent to a SiOx-coated surface near the nematic-isotropic transition. We have also observed the pretransitional growth of a planar-oriented liquid-crystal layer in the isotropic phase of the same system, with a negative orientational order parameter. Both behaviors can be explained quantitatively by the Landau–de Gennes theory.