Simultaneous Display and Intensity Measurement of Electron Diffraction Patterns
- 1 May 1969
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 40 (5), 735-736
- https://doi.org/10.1063/1.1684057
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
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- Quantitative reflection electron diffraction in an ultra high vacuum cameraSurface Science, 1967
- A Camera Tube with a Silicon Diode Array TargetBell System Technical Journal, 1967
- Reflection scanning electron diffraction with energy filteringJournal of Scientific Instruments, 1966
- THE OBSERVATION OF GAS ADSORPTION PHENOMENA BY REFLECTION HIGH-ENERGY ELECTRON DIFRACTIONApplied Physics Letters, 1965
- Semiconductor Particle DetectorsAnnual Review of Nuclear Science, 1962
- Low-Energy Electron Diffraction Study of Silicon Surface StructuresThe Journal of Chemical Physics, 1962