Comparison between microscopical aspects of a-Si films crystallized by pulsed UV excimer laser and calculated temperature profiles
- 1 December 1989
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 43 (1-4), 150-157
- https://doi.org/10.1016/0169-4332(89)90204-3
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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