Effect of vapour incidence angles on profile and properties of condensed films
- 1 April 1972
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 10 (1), 109-122
- https://doi.org/10.1016/0040-6090(72)90276-3
Abstract
No abstract availableThis publication has 17 references indexed in Scilit:
- Resistivity and Density of Ge Films Obliquely Deposited in VacuumJournal of Applied Physics, 1971
- COLUMNAR STRUCTURE IN THIN VACUUM-CONDENSED Pd FILMSApplied Physics Letters, 1966
- Influence of Oxygen on the Surface Mobility of Tin Atoms in Thin FilmsJournal of Applied Physics, 1964
- Anisotrope Struktur schräg Aufgedampfter AluminiumschichtenActa Physica Academiae Scientiarum Hungaricae, 1962
- Oblique-Incidence Anisotropy in Evaporated Permalloy FilmsJournal of Applied Physics, 1960
- Struktur des amorphen Germaniums und SiliciumsZeitschrift für Naturforschung A, 1958
- The effect of gettering on the reflectivity of aluminium filmsBritish Journal of Applied Physics, 1958
- The Effect of Vapor Incidence on the Structure of Evaporated Aluminum Films*Journal of the Optical Society of America, 1953
- Crystal growth and orientation in deposits condensed from the vapourActa Crystallographica, 1952
- The Growth and Structure of Thin Metallic FilmsJournal of Applied Physics, 1949