Reliability of 1.3 μm V-grooved inner-stripe laser diodes under high-power operation

Abstract

Aging tests of 1.3 μm laser diodes were performed under extremely high power levels up to 85% of the maximum CW output powers. We have verified high reliability under high power levels as high as 75% of the maximum CW output powers at room temperature. The median lifetime is estimated to be 7×104 h at 75% of the maximum CW output power.