The Effect of a Low Absorption Coefficient on X-Ray Spectrometer Measurements
- 1 October 1952
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 23 (10), 519-522
- https://doi.org/10.1063/1.1746074
Abstract
In x‐ray spectrometer measurements with a flat sample, low absorption produces an asymmetric broadening and displacement of the measured peak. The distortion of the peak due to low absorption can be corrected by an expression involving only the measured peak shape and its derivative. The distortion can also be corrected by the Stokes method of Fourier analysis, and values of the coefficients are given for a suitable range of experimental conditions.Keywords
This publication has 3 references indexed in Scilit:
- Geiger-Counter X-Ray Spectrometer - Influence of Size and Absorption Coefficient of Specimen on Position and Shape of Powder Diffraction MaximaJournal of Scientific Instruments, 1950
- Geometrical Factors Affecting the Contours of X-Ray Spectrometer Maxima. II. Factors Causing BroadeningJournal of Applied Physics, 1950
- A Numerical Fourier-analysis Method for the Correction of Widths and Shapes of Lines on X-ray Powder PhotographsProceedings of the Physical Society, 1948