Piezoresistive effects in thick-film resistors
- 1 June 1980
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 51 (6), 3282-3288
- https://doi.org/10.1063/1.328035
Abstract
Piezoresistive properties of thick‐film resistors obtained with ink series supplied by different manufacturers have been investigated as a function of composition, structure, sheet resistivity, and applied strain between 0 and ±1000 μ strain. The strain sensitivity of thick‐film resistors appears to be a strong function of the nature of the conductive grains and of the sheet resistivity of the paste; the results obtained suggest a dominant role of the tunneling effect in the conduction mechanism and in the strain sensitivity.Keywords
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