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Stress concentration in silicon-insulator interfaces
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Stress concentration in silicon-insulator interfaces
Stress concentration in silicon-insulator interfaces
JS
Julio H. Serebrinsky
Julio H. Serebrinsky
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30 November 1970
journal article
Published by
Elsevier
in
Solid-State Electronics
Vol. 13
(11)
,
1435-1444
https://doi.org/10.1016/0038-1101(70)90079-1
Abstract
No abstract available
Keywords
STRESS CONCENTRATION
Cited by 23 articles