Physical Profile Measurements in Insulating Layers Using the Ion Analyser
- 1 January 1973
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- A radiotracer technique for measuring the reflection of heavy ions (of keV energies) from solid surfacesRadiation Effects, 1971
- Smoothing by spline functionsNumerische Mathematik, 1967