Specimen preparation technique for high resolution transmission electron microscopy studies on model supported metal catalysts
- 1 July 1986
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 143 (1), 103-116
- https://doi.org/10.1111/j.1365-2818.1986.tb02768.x
Abstract
No abstract availableKeywords
This publication has 15 references indexed in Scilit:
- The morphology of rhodium supported on TiO2 and Al2O3 as studied by temperature-programmed reduction-oxidation and transmission electron microscopyJournal of Catalysis, 1985
- Effective surfaces of semiconductor catalysts for light-induced heterogeneous reactions evaluated by simultaneous photodeposition of both oxidation and reduction productsThe Journal of Physical Chemistry, 1983
- Contrast effects in the transmission electron microscopy of supported crystalline catalyst particlesJournal of Catalysis, 1980
- Electron microscopy of supported metal particles I. Behavior of Pt on titanium oxide, aluminum oxide, silicon oxide, and carbonJournal of Catalysis, 1979
- The Nucleation Reaction on Photosensitive TiO2 FilmsJournal of the Electrochemical Society, 1975
- The limitation of the transmission electron microscope for characterization of supported metal catalystsJournal of Catalysis, 1974
- On the Origin of the Photocatalytic Deposition of Noble Metals on TiO[sub 2]Journal of the Electrochemical Society, 1974
- Imaging the Rhodium Atom with a Conventional High Resolution Electron MicroscopeNature, 1971
- Visibility of Single AtomsScience, 1970