Using stopping foils for depth determination by particle induced X-ray emission
- 1 December 1979
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 166 (3), 503-506
- https://doi.org/10.1016/0029-554x(79)90541-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Ion-excitedx-ray satellite spectra of Si, S, Cl, and Ar in the gas phasePhysical Review A, 1978
- SOME EXPERIENCES WITH X‐RAY AND PROTON MICROSCOPES*Annals of the New York Academy of Sciences, 1978
- A method of determining the depth of impurities by proton-induced X-raysNuclear Instruments and Methods, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Röntgen-Ausbeuten bei ?-AnregungIsotopenpraxis Isotopes in Environmental and Health Studies, 1968