The method of integral characteristics in X-ray diffraction studies of the structure of the surface layers of single crystals
- 16 April 1981
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 64 (2), 435-442
- https://doi.org/10.1002/pssa.2210640203
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Effect of Alpha Irradiation on the X-Ray Diffraction Profiles of Silicon Single CrystalsJournal of Applied Physics, 1969
- X‐Ray Investigation of Lattice Deformations in Silicon Induced through High‐Energy Ion ImplantationPhysica Status Solidi (b), 1969
- Application de la théorie dynamique de la diffraction X à l'étude de la diffusion du bore et du phosphore dans les cristaux de siliciumActa Crystallographica Section A Foundations and Advances, 1968
- Dynamical theory of diffraction applicable to crystals with any kind of small distortionActa Crystallographica, 1962