Local magnification effects in the atom probe
- 1 April 1991
- journal article
- Published by Elsevier in Surface Science
- Vol. 246 (1-3), 442-449
- https://doi.org/10.1016/0039-6028(91)90449-3
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Some aspects of the measurement of precipitate size in the field-ion microscopeSurface Science, 1991
- Materials analysis with a position‐sensitive atom probeJournal of Microscopy, 1989
- DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBELe Journal de Physique Colloques, 1988
- Application of a position-sensitive detector to atom probe microanalysisReview of Scientific Instruments, 1988