Anisotropic momentum densities from Compton profiles: Silicon
- 15 March 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 15 (6), 3039-3044
- https://doi.org/10.1103/physrevb.15.3039
Abstract
A new inversion procedure, based on Fourier analysis, is developed. Application is made to the silicon data of W. A. Reed and P. Eisenberger. The important experimental question of the relation between the number of sets of profiles, data lines, and the accuracy of the inverted momentum density is answered in detail. The inversion procedure may also be applied to a related problem in positron annihilation.Keywords
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