Structure of the Ag on Si(111) 7 × 7 interface by means of surface exafs
- 1 December 1983
- journal article
- Published by Elsevier in Surface Science
- Vol. 134 (3), 813-835
- https://doi.org/10.1016/0039-6028(83)90076-6
Abstract
No abstract availableKeywords
This publication has 34 references indexed in Scilit:
- Angle resolved photoemission measurements on AgSi(111) 7 × 7 interfacesSurface Science, 1983
- Low energy electron diffraction, Auger electron spectroscopy and angle-resolved photoemission from silver films on Si(100) and Si(111)Thin Solid Films, 1982
- A structure analysis of Ag-adsorbed Si(111) surface by LEED/CMTASurface Science, 1982
- Chemical reaction at the Ge(111)-Ag and Si(111)-Ag interfaces for small Ag coveragesSurface Science, 1981
- New Models for Metal-Induced Reconstructions on Si(111)Physical Review Letters, 1981
- Cohesive energy of the two-dimensional Si(111)3 × 1 Ag and Si(111)√3-R(30°)Ag phases of the Silver (deposit)-silicon(111) (substrate) systemSurface Science, 1978
- Investigation of the initial stages of growth of Ag films on Si(111)7 × 7 by a combination of LEED, AES, and UPSSurface Science, 1978
- Epitaxy of noble metals and (111) surface superstructures of silicon and germanium part I: Study at room temperatureThin Solid Films, 1976
- Recent advances in epitaxyThin Solid Films, 1972
- Untersuchungen zum schichtwachstum von silber auf der silizium(111)-oberfläche durch beugung langsamer elektronenSurface Science, 1967