Electron energy-loss spectrum-imaging
- 31 October 1991
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 38 (1), 47-73
- https://doi.org/10.1016/0304-3991(91)90108-i
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
- Plural-scattering deconvolution of electron energy-loss spectra recorded with an angle-limiting apertureUltramicroscopy, 1990
- Spectrum-image: The next step in EELS digital acquisition and processingUltramicroscopy, 1989
- Improved parallel-detection Electron-Energy-Loss SpectrometerUltramicroscopy, 1989
- EELS log‐ratio technique for specimen‐thickness measurement in the TEMJournal of Electron Microscopy Technique, 1988
- Parallel detection electron spectrometer using quadrupole lensesUltramicroscopy, 1987
- Electron energy loss analysis of near-trace-element concentrations of calciumUltramicroscopy, 1986
- Fourier deconvolution of electron energy-loss spectraProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1985
- Unconventional modes for STEM imaging of biological structuresJournal of Ultrastructure Research, 1984
- Compositional mapping in biology: X rays and electronsJournal of Ultrastructure Research, 1984
- A Fourier series method for numerical Kramers-Kronig analysisJournal of Physics A: General Physics, 1975