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A New Scaling Methodology For The 0.1 - 0.025/spl mu/m MOSFET
Home
Publications
A New Scaling Methodology For The 0.1 - 0.025/spl mu/m MOSFET
A New Scaling Methodology For The 0.1 - 0.025/spl mu/m MOSFET
FI
Fiegna
Fiegna
IW
Iwai
Iwai
WA
Wada
Wada
SA
Saito
Saito
SA
Sangiorgi
Sangiorgi
RI
Ricco
Ricco
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1 January 1993
conference paper
Published by
Institute of Electrical and Electronics Engineers (IEEE)
p.
33-34
https://doi.org/10.1109/vlsit.1993.760231
Abstract
No abstract available
Cited by 31 articles