A new approach to A.C. characterization of bipolar transistors
- 31 August 1988
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 31 (8), 1269-1275
- https://doi.org/10.1016/0038-1101(88)90426-1
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Partitioned-charge-based modeling of bipolar transistors for non-quasi-static circuit simulationIEEE Electron Device Letters, 1986
- A simple regional analysis of transit times in bipolar transistorsSolid-State Electronics, 1986
- Three-dimensional derivations of the bipolar reciprocity theorem and Gummel's equationIEEE Transactions on Electron Devices, 1986
- Past and Present of the Charge-Control Concept in the Characterization of the Bipolar TransistorPublished by Elsevier ,1976
- Simplified computer-aided analysis of double-diffused transistors including two-dimensional high-level effectsIEEE Transactions on Electron Devices, 1972
- A theory of transistor cutoff frequency (fT) falloff at high current densitiesIRE Transactions on Electron Devices, 1962