Study of surface roughness using microdensitometer analysis of electron micrographs of surface replicas II: Autocovariance functions
- 1 October 1981
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 71 (10), 1230
- https://doi.org/10.1364/josa.71.001230
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 15 references indexed in Scilit:
- Study of surface roughness using a microdensitometer analysis of electron micrographs of surface replicas: I Surface profilesJournal of the Optical Society of America, 1981
- Relation between the angular dependence of scattering and the statistical properties of optical surfacesJournal of the Optical Society of America, 1979
- Diffraction and diffuse scattering from dielectric multilayersJournal of the Optical Society of America, 1979
- Optical and Photoelectric Properties of Mg in the Vacuum UltravioletPhysical Review B, 1973
- Effect of Different Roughnesses on the Excitation by Photons of the Surface Plasmon of AluminumJournal of the Optical Society of America, 1972
- Study of Aluminum Films. I. Optical Studies of Reflectance Drops and Surface Oscillations on Controlled-Roughness FilmsPhysical Review B, 1971
- Photon-surface plasmon coupling at a dielectric solidPhysics Letters A, 1970
- Study of the Interaction of Light with Rough Metal Surfaces. I. ExperimentPhysical Review B, 1970
- Anomalous Reststrahl Structure from Slight Surface RoughnessPhysical Review B, 1967
- Relation Between Surface Roughness and Specular Reflectance at Normal IncidenceJournal of the Optical Society of America, 1961