The use of atomic force microscopy to quantify membrane surface electrical properties
- 1 March 2002
- journal article
- Published by Elsevier in Colloids and Surfaces A: Physicochemical and Engineering Aspects
- Vol. 201 (1-3), 73-83
- https://doi.org/10.1016/s0927-7757(01)00790-7
Abstract
No abstract availableThis publication has 24 references indexed in Scilit:
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