Measurement of the variation of frequency with the ambient temperature of microwave semiconductor oscillators

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1 October 1970

journal article
Published by IOP Publishing in Journal of Physics E: Scientific Instruments

Vol. 3 (10), 801-805
https://doi.org/10.1088/0022-3735/3/10/314

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

An automatic equipment for recording the frequency variation of x-band oscillators with temperature over the range −40 to + 70°c with particular reference to gunn oscillators
Radio and Electronic Engineer, 1970

Cited by 4 articles