Microscopic Characterization of Pb0.9l La0.09(Zr0.65Ti0.35)0.98O3
- 1 February 1984
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 67 (2), C‐29-C‐31
- https://doi.org/10.1111/j.1151-2916.1984.tb09616.x
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Transmission Electron Microscopy of Pb(Zr0.52Ti0.48)O3Journal of the American Ceramic Society, 1981
- Observation of Microcracks and Thin Intergranular Films in Ceramics by Transmission Electron MicroscopyJournal of the American Ceramic Society, 1980
- On the detection of thin intergranular films by electron microscopyUltramicroscopy, 1979
- Imaging of thin intergranular phases by high-resolution electron microscopyJournal of Applied Physics, 1979
- Grain Boundary Phases in a Hot‐Pressed MgO Fluxed Silicon NitrideJournal of the American Ceramic Society, 1977
- Improvements in Atmosphere Sintering of Transparent PLZT CeramicsJournal of the American Ceramic Society, 1973
- Fabrication of Transparent Electrooptic PLZT Ceramics by Atmosphere SinteringJournal of the American Ceramic Society, 1973
- Improved Hot‐Pressed Electrooptic Ceramics in the (Pb,La)(Zr,Ti)O3 SystemJournal of the American Ceramic Society, 1971
- Hot‐Pressed (Pb,La)(Zr,Ti)O3 Ferroelectric Ceramics for Electrooptic ApplicationsJournal of the American Ceramic Society, 1971
- Ferroelectric ceramic electrooptic materials and devicesProceedings of the IEEE, 1969