Direct Analysis of the Structure, Concentration, and Chemical Activity of Surface Atomic Vacancies by Specialized Low-Energy Ion-Scattering Spectroscopy: TiC(001)
- 25 April 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 50 (17), 1293-1296
- https://doi.org/10.1103/physrevlett.50.1293
Abstract
The structure, concentration, and chemical activity of atomic vacancies at the TiC(001) surface have been directly analyzed by specialized low-energy ion-scattering spectroscopy. It has been found that carbon vacancies are formed at the surface under a certain condition, and they capture oxygen atoms into the vacancy holes exhibiting a very high activity.Keywords
This publication has 10 references indexed in Scilit:
- Interaction Potential between He+ and Ti in a keV Range as Revealed by a Specialized Technique in Ion Scattering SpectroscopyJapanese Journal of Applied Physics, 1982
- Low-Energy Ion Scattering from the Si(001) SurfacePhysical Review Letters, 1982
- Preferential sputtering of TiC and TiB2 coatings under D+ and 4He+ bombardment: Partial yieldsJournal of Vacuum Science and Technology, 1982
- Quantitative Surface Atomic Geometry and Two-Dimensional Surface Electron Distribution Analysis by a New Technique in Low-Energy Ion ScatteringJapanese Journal of Applied Physics, 1981
- Clean TiC(001) surface and oxygen chemisorption studied by work function measurement, angle-resolved X-RAY photoelectron spectroscopy, ultraviolet photoelectron spectroscopy and ion scattering spectroscopySurface Science, 1981
- The structure of a stepped copper (410) surface determined by ion scattering spectroscopySurface Science, 1980
- Catalytic activities of TiC, WC, and TaC for hydrogenation of ethyleneJournal of Catalysis, 1979
- Oxygen adsorption on Cu(Surface Science, 1979
- Surface analysis with low energy ion scatteringApplied Physics A, 1976
- Field Emission Studies of TiC Single CrystalJapanese Journal of Applied Physics, 1974