Dielectric properties of polystyrene thin films formed by rf electrodeless excitation

Abstract

The temperature coefficient of the dielectric constant for the common polystyrene films is negative, while that for films formed by rf electrodeless excitation is positive. From the measurements of the coefficient of linear expansion and of thermally stimulated current (TSC), it is found that the negative coefficient for the polystyrene films is due to the expansion of volume, while on the other hand, the positive coefficient for the thin films is due to the occurrences of dipoles having widely distributed relaxation times.