A method to eliminate the background in X-ray diffraction patterns of oriented clay mineral samples
- 1 December 1981
- journal article
- Published by Mineralogical Society in Clay Minerals
- Vol. 16 (4), 383-393
- https://doi.org/10.1180/claymin.1981.016.4.07
Abstract
A method is described for calculating, and then subtracting, the background from X-ray diffraction patterns of oriented clay mineral samples. Ti-Kα radiation is used and, to minimize the absorption of this radiation by air, a vacuum and helium-flushed device has been developed. This device can be used with other X-ray sources, offering a considerable increase of intensity—e.g. Co-Kα radiation is increased by 125%. With the background-eliminated patterns a better semi-quantitative estimate of the composition of clay mineral mixtures is possible. Small differences in composition of two samples can be identified by subtracting one of the background-eliminated patterns from the other. Using this method, peak maxima of smectite-group minerals can also be accurately determined.Keywords
This publication has 5 references indexed in Scilit:
- Determination, a l'echelle absolue, de l'intensite diffractee aux rayons X par les argilesClay Minerals, 1980
- Quantitative X-ray Powder Diffraction Analyses of Clays Using an Orienting Internal Standard and Pressed Disks of Bulk Shale SamplesClays and Clay Minerals, 1976
- Direct diffractometric quantitative analysis of synthetic clay mineral mixtures with molybdenite as orientation-indicatorJournal of Sedimentary Research, 1970
- Interprétation de la diffusion centrale des rayons X par les systèmes poreux. II. Exemples d'applicationJournal of Applied Crystallography, 1969
- Zur qualitativen und quantitativen röntgenographischen Bestimmung von Dreischicht-Tonmineralen in BödenJournal of Plant Nutrition and Soil Science, 1965