An investigation into the presence of secondary electrons in megavoltage photon beams (radiotherapy application)
- 1 September 1983
- journal article
- Published by IOP Publishing in Physics in Medicine & Biology
- Vol. 28 (9), 1033-1043
- https://doi.org/10.1088/0031-9155/28/9/003
Abstract
The presence of secondary electrons in photon beams of 60Co and 4, 8, 10 15 and 25 MV X-rays has been studied by measuring surface charge using thin window ionisation chambers. Measurements have been made for square fields from 4*4 cm2 to 35*35 cm2 for locations from the collimator head to a distance of 4 m from the target. In addition, measurements have been made from rectangular fields at 10 MV and 25 MV for fields of equivalent area from 5*5 cm2 to 25*25 cm2. By eliminating the inverse square effect, the presence of contaminants from the head and the effect of build-up in air are clearly seen and well separated. Comparison between the curves at different energies indicates an increasing effect of contamination from the head with energy and a decreasing effect of electron production in air with increasing energy.Keywords
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