Tensile strain relaxation in GaNxP1−x (x≤0.1) grown by chemical beam epitaxy
- 1 July 1996
- journal article
- conference paper
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 14 (4), 2952-2956
- https://doi.org/10.1116/1.588941