The comparison of transition metal concentration ratios determined by EELS and EDX
- 1 April 1987
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 146 (1), 1-16
- https://doi.org/10.1111/j.1365-2818.1987.tb01322.x
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Correcting electron energy loss spectra for artefacts introduced by a serial data collection systemJournal of Microscopy, 1984
- Understanding thin film X-ray spectraJournal of Microscopy, 1984
- Determination of Cliff‐Lorimer k factors by analysis of crystallized microdropletsJournal of Microscopy, 1984
- Experimental and theoretical determination of kAFe factors for quantitative X‐ray microanalysis in the analytical electron microscopeJournal of Microscopy, 1984
- X‐ray production in thin films by electrons with energies between 40 and 100 keV. 2—Characteristic cross‐sections and the overall x‐ray spectrumX-Ray Spectrometry, 1983
- Study of theedges in thetransition metals and their oxides by electron-energy-loss spectroscopy with comparisons to theoryPhysical Review B, 1982
- Kβ/Kα ratios in energy‐dispersive x‐ray emission analysisX-Ray Spectrometry, 1980
- An evaluation of K-shell fluorescence yields; observation of outer-shell effectsJournal of Physics B: Atomic and Molecular Physics, 1979
- Cross sections for ionization of inner-shell electrons by electronsReviews of Modern Physics, 1976
- Escape peaks and internal fluorescence in X-ray spectra recorded with lithium drifted silicon detectorsJournal of Physics E: Scientific Instruments, 1972