Degradation of Electrical Contacts Caused by Oscillatory Micromotion Between the Contact Members
- 1 March 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 2 (1), 32-36
- https://doi.org/10.1109/tchmt.1979.1135432
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Development of resistance at a disturbed contact: with special reference to silver, copper and nickel-silverProceedings of the Institution of Electrical Engineers, 1976
- Connectors for Aluminum Cables: A Study of the Degradation Mechanisms and Design Criteria for Reliable ConnectorsIEEE Transactions on Parts, Hybrids, and Packaging, 1973
- Degradation mechanisms of mechanical connectors on aluminium conductorsProceedings of the Institution of Electrical Engineers, 1973
- Aluminum Contact Surfaces in Electrical Transition InterfacesIEEE Transactions on Parts, Materials and Packaging, 1969
- The Failure Mode and Lifetime of Static ContactsIEEE Transactions on Parts, Materials and Packaging, 1968