Dielectric Breakdown and Recovery of X-Cut Quartz under Shock-Wave Compression

Abstract

While a shock wave is traversing a disk of X‐cut quartz, a piezoelectric current flows in an external circuit connected across the faces of the disk. In this paper measurements of this current are used to study dielectric breakdown and subsequent recovery which occurs in quartz. Quartz specimen disks were impacted at various stress levels in such a way as to produce shock waves that propagated along the X axis either in the direction of or opposite to that of the pressure‐induced polarization. In the latter case, short‐circuit current measurements show that breakdown occurs at a threshold stress greater than 10 and less than 13 kbar. Since the impact experiment produced one‐dimensional electrical and mechanical conditions in the specimen disk, it was possible to formulate a mathematical model that permitted solutions for internal electrical fields and resistivity in terms of the measured current. Computations with this model show that the field in the stressed portion of the disk at breakdown is about 7.0×10⁵ V/cm, which is an order of magnitude lower than the value observed at atmospheric pressure. Computations with the model also show that recovery from breakdown to essentially infinite values of resistivity occurs during the transit time of the shock wave when the field in the stressed region of the disk is ``quenched'' to a value of about 1.9×10⁵ V/cm. This critical field appears to be the same for all shock stress levels investigated from 13 to 35 kbar. The dependence of the initiation of breakdown on the direction of wave propagation relative to the polarization direction indicates that the shock‐wave front furnishes a source of free electrons.