Surface analysis and grain-boundary segregation measurements using atom-probe techniques
- 31 December 1979
- journal article
- Published by Elsevier in Surface Science
- Vol. 89 (1-3), 718-724
- https://doi.org/10.1016/0039-6028(79)90651-4
Abstract
No abstract availableKeywords
This publication has 12 references indexed in Scilit:
- An imaging atom probe using a single time-gated channel plateJournal of Physics E: Scientific Instruments, 1978
- Surface studies with an imaging atom-probeSurface Science, 1977
- Some applications of field-ionization and field-evaporation techniques in the study of surfacesSurface Science, 1975
- Energy deficits in pulsed field evaporation and deficit compensated atom-probe designsReview of Scientific Instruments, 1974
- The crystallographic distribution of field-desorbed speciesJournal of Vacuum Science and Technology, 1974
- Some Applications of Field-Ion Atom-Probe Analysis to Iron and SteelsMetal Science Journal, 1973
- Multiple-focusing time-of-flight mass spectrometers Part II. TOFMS with equal energy accelerationInternational Journal of Mass Spectrometry and Ion Physics, 1972
- Use of Channel-plate Intensifies in the Field-ion MicroscopePublished by Elsevier ,1972
- FIM-atom probe analysis of thin nitride platelets in Fe-3 at.% MoScripta Metallurgica, 1971
- The Atom-Probe Field Ion MicroscopeReview of Scientific Instruments, 1968