Study of various types of diamonds by measurements of double crystal x-ray diffraction and positron annihilation
- 1 August 1995
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 78 (3), 1510-1513
- https://doi.org/10.1063/1.360242
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Resonant Raman scattering of amorphous carbon and polycrystalline diamond filmsPhysical Review B, 1989
- Screening of positrons in semiconductors and insulatorsPhysical Review B, 1989
- Characterization of diamond films by Raman spectroscopyJournal of Materials Research, 1989