Capacitance-voltage measurement of charged defect concentration profile near semiconductor depletion zones
- 15 February 1995
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 77 (4), 1627-1634
- https://doi.org/10.1063/1.358918
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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