Sample-thickness dependence and chemical effects in SIMS depth profiling of multilayer langmuir-blodgett films
- 1 January 1986
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 18 (1-6), 639-643
- https://doi.org/10.1016/s0168-583x(86)80102-1
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- Beam-induced broadening effects in sputter depth profilingVacuum, 1984
- Synthesis of novel inorganic films by ion beam irradiation of polymer filmsApplied Physics Letters, 1983
- Secondary-ion mass spectrometry of organized organic model systemsInternational Journal of Mass Spectrometry and Ion Physics, 1983
- Design and performance of quadrupole-based SIMS instruments: a critical reviewVacuum, 1982
- Anomalous enhancement of negative sputtered ion emission by oxygenSurface Science, 1978
- Raster scanning depth profiling of layer structuresApplied Physics A, 1977
- Secondary-ion emission of amino acidsApplied Physics B Laser and Optics, 1976
- Sputtering of chemisorbed gas (nitrogen on tungsten) by low-energy ionsJournal of Applied Physics, 1974
- Films Built by Depositing Successive Monomolecular Layers on a Solid SurfaceJournal of the American Chemical Society, 1935
- THE CONSTITUTION AND FUNDAMENTAL PROPERTIES OF SOLIDS AND LIQUIDS. II. LIQUIDS.1Journal of the American Chemical Society, 1917