Cyclotron resonance and the role of polaron effects in surface layers on Hg1−xCdxTe
- 31 May 1983
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 46 (8), 665-668
- https://doi.org/10.1016/0038-1098(83)90209-0
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
- Coupled subband-phonon resonances in the far-infrared reflection from Hg1−xCdxTe surfacesSolid State Communications, 1983
- Far-infrared cyclotron resonance of two-dimensional electrons in an AlxGa1−xAs/GaAs heterojunctionSurface Science, 1982
- Magnetoconductance study of accumulation layers onPhysical Review B, 1981
- Theory of Electronic Properties in N-Channel Inversion Layers on Narrow-Gap Semiconductors. II. Inter-Subband Optical Absorption on InSbJournal of the Physics Society Japan, 1981
- Two-mode resonant polaron in the Hg0.72Cd0.28Te semiconductorSolid State Communications, 1978
- A circular polarizer for reflection in the far-infraredInfrared Physics, 1978
- Far-infra-red cyclotron resonance in the inversion layer onp-Hg1−x Cd x TeIl Nuovo Cimento B (1971-1996), 1977
- Surface cyclotron resonance in InSbSolid State Communications, 1975
- Theory of Cyclotron Resonance Lineshape in a Two-Dimensional Electron SystemJournal of the Physics Society Japan, 1975
- Polaron Effects in the Cyclotron-Resonance Absorption of InSbPhysical Review Letters, 1967