De-correlation Effects in Speckle-pattern Interferometry. 1. Wavelength change dependent de-correlation with application to contouring and surface roughness measurement
- 1 May 1977
- journal article
- research article
- Published by Taylor & Francis in Optica Acta: International Journal of Optics
- Vol. 24 (5), 517-532
- https://doi.org/10.1080/716099422
Abstract
A theoretical investigation of the de-correlation of speckle pattern with change of wavelength has been performed with particular reference to the electronic speckle-pattern interferometer. A method of measuring surface roughness using speckle de-correlation is proposed and some preliminary results presented. In addition, the loss of fringe visibility in two-wavelength speckle-pattern interferometric contouring is investigated and experimental confirmation of the theory given.Keywords
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