Measurement of diffusion-induced strains at metal bond interfaces
- 29 February 1968
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 11 (2), 205-208
- https://doi.org/10.1016/0038-1101(68)90080-4
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Diffusion in evaporated films of gold-aluminiumPhilosophical Magazine, 1962