Measurement of lattice parameter differences on semiconductor crystals due to diffusion doping
- 16 February 1973
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 15 (2), K87-K89
- https://doi.org/10.1002/pssa.2210150248
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Zur röntgenographischen Bestimmung des Typs einzelner Versetzungen in EinkristallenThe European Physical Journal A, 1958
- Über eine röntgenographische Methode zur Untersuchung von Gitterstörungen an KristallenThe Science of Nature, 1931