A quantitative X-ray microanalysis thin film method using K-, L-, and M-lines
- 31 December 1981
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 6 (4), 323-334
- https://doi.org/10.1016/s0304-3991(81)80234-3
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- Cross sections for ionization of inner-shell electrons by electronsReviews of Modern Physics, 1976
- Atomic Fluorescence YieldsReviews of Modern Physics, 1966
- Le rendement de fluorescenceJournal de Physique et le Radium, 1955