EXAFS in photoelectron yield spectra and optimisation of the photon glancing angle
- 28 July 1978
- journal article
- Published by IOP Publishing in Journal of Physics C: Solid State Physics
- Vol. 11 (14), 3125-3133
- https://doi.org/10.1088/0022-3719/11/14/032
Abstract
The variation with the photon energy of the photoelectron yield of Cu has been measured near the K edge. The fine structure of the yield agrees with the fine structure of absorption spectra (EXAFS). The radial structure function, the envelope function, and the scattering phase of a single Cu shell have been calculated from the yield spectrum. The results are similar to those extracted from the absorption coefficient. The yield increases with decreasing glancing angle of the incident photons. A variation of the height of the Cu edge and the amplitude of the EXAFS modulation with this angle is observed. This is explained by the escape mechanism of the electrons.Keywords
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