Single-Crystal Germanium
- 1 August 1952
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IRE
- Vol. 40 (8), 906-909
- https://doi.org/10.1109/jrproc.1952.274096
Abstract
Significant advances have been made in the development of new types of transistors, photocells, and rectifiers and in the improvement of the reproducibility and reliability of the point-contact transistor. A key factor in this development has been the use of single-crystal germanium having a high degree of lattice perfection and compositional control. Of particular interest to the device-development engineer is the fact that the rectifying barriers between the p-type and n-type sections behave in a manner predictable from the measured properties of each section. The exceptionally long lifetime of injected carriers observed in the material and the high degree of control over its chemical composition make it ideally suitable for the production of p-n structures. The ranges of properties of germanium single crystals which are now realizable are given, as well as their present degree of control.Keywords
This publication has 9 references indexed in Scilit:
- Present Status of Transistor DevelopmentProceedings of the IRE, 1952
- Observations of Zener Current in GermaniumJunctionsPhysical Review B, 1951
- Junction TransistorsPhysical Review B, 1951
- Some Circuit Properties and Applications of n-p-n TransistorsProceedings of the IRE, 1951
- Junction Rectifier and Photo-CellPhysical Review B, 1951
- The Mobility and Life of Injected Holes and Electrons in GermaniumPhysical Review B, 1951
- Correlation of Geiger Counter and Hall Effect Measurements in Alloys Containing Germanium and Radioactive Antimony 124Physical Review B, 1950
- The Theory ofp-nJunctions in Semiconductors andp-nJunction TransistorsBell System Technical Journal, 1949
- Physical Principles Involved in Transistor ActionPhysical Review B, 1949