Some aspects of x-ray fluorescence spectrometers for trace element analysis
- 15 May 1972
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 101 (1), 127-135
- https://doi.org/10.1016/0029-554x(72)90766-5
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
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- Application of High-Resolution Semiconductor Detectors in X-ray Emission SpectrographyScience, 1966
- Geometric Control of Surface Leakage Current and Noise in Lithium Drifted Silicon Radiation DetectorsIEEE Transactions on Nuclear Science, 1966
- A preamplifier with 0.7 keV resolution for semiconductor radiation detectorsNuclear Instruments and Methods, 1965